Reduction of The Energy Gap Pressure Coefficient of GaN Due to The Constraining Presence of The Sapphire Substrate
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- Category: Tungsten & Sapphire Growth Furnace News
- Published on Tuesday, 14 January 2014 11:56
We have performed a detailed investigation of the photoluminescence pressure dependence of heteroepitaxial GaN thin films on sapphire substrates. A comparison between as grown GaN on sapphire and free-standing GaN membranes, created using a laser assisted substrate liftoff process, revealed that the presence of the sapphire substrate leads to an energy gap pressure coefficient reduction of approximately 5%. This result agrees with the numerical simulations presented in this article. We established that the linear pressure coefficient of free-standing GaN is 41.4±0.2 meV/GPa, and that the deformation potential of the energy gap is -9.36±0.04 eV. Our results also suggest a new, lower value of the pressure derivative for the bulk modulus of GaN (B′=3.5).
Roughened surfaces of light-emitting diodes (LEDs) provide substantial improvement in light extraction efficiency. By using the laser-lift-off technique followed by an anisotropic etching process to roughen the surface, an n-side-up GaN-based LED with a hexagonal “conelike” surface has been fabricated. The enhancement of the LED output power depends on the surface conditions. The output power of an optimally roughened surface LED shows a twofold to threefold increase compared to that of an LED before surface roughening.
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