Tungsten Carbide Test Probe

Due to its excellent performance, tungsten carbide test probe has been widely used in high-precision electronic hardware test and has longer service life than other materials. According to the structure, tungsten carbide test probe can be specifically divided into cantilever probe (blade type, epoxy type) and the vertical probe (ICT series probes, interface probes, micro-series probes, switch probes, coaxial probes, rotator probes, high current probes, semi-conductor probes, battery and connector contacts, wire test probes). Or it can be also divided by electrical test application:
1. Optical circuit board test probe: the test of the circuit board and short circuit before component installation, most of the domestic probe products can replace imported products;
2. Online test probe: Test for PCB circuit board mounted components, the core technology of high-end products is still under controlled by foreign industry, some of probes domestic have been developed successfully;
3. Microelectronic test probe: the test wafer or chip IC detection probe, the core technology is still in control of foreign companies, domestic manufacturers actively involved in research and development, but only a small part of the success of the production.

In order to ensure the measuring accuracy of test probe, we should notice that:
1. Probe length as short as possible: to reduce bending or deflection of the probe on accuracy;
2. Minimum connection point: every time the probe and the extension rod connected together, the equivalent of an additional introduction of a new potential bending and deformation point;
3. Detection ball as large as possible: make the ball / stem clearance maximum, thus reducing the possibility of false triggering due shake, and may weaken the influence of the measured surface unpolished part on the accuracy caused.

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