Customizing tungsten probes for LED wafer testing involves tailoring the probes to meet specific requirements and preferences based on the characteristics of LED components and the testing process. 

In wafer testing, various types of tungsten probes are used to make electrical contact with semiconductor devices on the wafer. The choice of probe type depends on the specific requirements of the testing process. 

Tungsten probes used for LED (Light Emitting Diode) wafer testing are specialized probes designed for making electrical contact with LED devices during the testing and inspection processes. 

Tungsten probes are commonly used for wafer testing due to several advantageous properties that make them suitable for this application: